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Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow.
- Source :
- 2015 45th European Solid State Device Research Conference (ESSDERC); 2015, p238-241, 4p
- Publication Year :
- 2015
Details
- Language :
- English
- ISBNs :
- 9781467371339
- Database :
- Complementary Index
- Journal :
- 2015 45th European Solid State Device Research Conference (ESSDERC)
- Publication Type :
- Conference
- Accession number :
- 111580692
- Full Text :
- https://doi.org/10.1109/ESSDERC.2015.7324758