Dynamic Gate Stress-Induced V\text {TH} Shift and Its Impact on Dynamic R\mathrm {ON} in GaN MIS-HEMTs.

Very fast transients of V {\text {TH}} shift and their impact on R\mathrm{\scriptscriptstyle ON} under dynamic AC (1 k–1 MHz) positive gate stress in depletion-mode (D-mode) metal–insulator–semiconductor high-electron-mobility transistors (MIS-HEMTs) are revealed. We achieve data acquisition within 120 ns right after each stress pulse throughout the entire stress time range from 10^ -7 up to 10^ 3 s, by virtue of a short stress-to-sense delay of \sim 100 ns and high sampling rate up to 50 MSa/s. Despite the considerable V_{\mathrm {\mathbf {TH}}} shift, its impact on R\mathrm{\scriptscriptstyle ON} in D-mode MIS-HEMT is modest, if the device is under sufficient gate overdrive. Furthermore, V_{\mathrm {\mathbf {TH}}}$ shift and the consequent R\mathrm{\scriptscriptstyle ON} increase under dynamic stress, which are more relevant to high-frequency switching operation, exhibits frequency dependence within 1 k–1 MHz and is always smaller than that under conventionally used static (constant) stress. [ABSTRACT FROM PUBLISHER]