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X-ray emission from 424-MeV/u C ions impacting on selected target.

Authors :
Rui Cheng
Yu Lei
Yu-Yu Wang
Guo-Qing Xiao
Xian-Ming Zhou
Yuan-Bo Sun
Ge Xu
Xing Wang
Yong-Tao Zhao
Xi-Meng Chen
Ce-Xiang Mei
Xiao-An Zhang
Source :
Chinese Physics B; Feb2016, Vol. 25 Issue 2, p1-1, 1p
Publication Year :
2016

Abstract

The K-shell x-rays of Ti, V, Fe, Co, Ni, Cu, and Zn induced by 424-MeV/u C<superscript>6+</superscript> ion impact are measured. It is found that the K x-ray shifts to the high energy side and the intensity ratio of Kβ/Kα is larger than the atomic data, owing to the L-shell multiple-ionization. The x-ray production cross sections are deduced from the experimental counts and compared with the binary encounter approximation (BEA), plane wave approximation (PWBA) and energy-loss Coulomb-repulsion perturbed-stationary-state relativistic (ECPSSR) theoretical predictions. The BEA model with considering the multiple-ionization fluorescence yield is in better consistence with the experimental results. In addition, the cross section as a function of target atomic K-shell binding energy is presented. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
16741056
Volume :
25
Issue :
2
Database :
Complementary Index
Journal :
Chinese Physics B
Publication Type :
Academic Journal
Accession number :
112747789
Full Text :
https://doi.org/10.1088/1674-1056/25/2/023402