HV GaN reliability and status.

Authors :: Khalil, Sameh G.
Hardikar, Shyam
Sack, Steffen
Persson, Eric
Imam, Mohamed
McDonald, Tim
Source :: 2015 IEEE 3rd Workshop on Wide Bandgap Power Devices & Applications (WiPDA); 2015, p21-23, 3p
Publication Year :: 2015

Language :: English
ISBNs :: 9781467378857
Database :: Complementary Index
Journal :: 2015 IEEE 3rd Workshop on Wide Bandgap Power Devices & Applications (WiPDA)
Publication Type :: Conference
Accession number :: 112878142
Full Text :: https://doi.org/10.1109/WiPDA.2015.7369307