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Spatially resolved TiOx phases in switched RRAM devices using soft X-ray spectromicroscopy.

Authors :
Carta, D.
Hitchcock, A. P.
Guttmann, P.
Regoutz, A.
Khiat, A.
Serb, A.
Gupta, I.
Prodromakis, T.
Source :
Scientific Reports; 2/19/2016, p21525, 1p
Publication Year :
2016

Details

Language :
English
ISSN :
20452322
Database :
Complementary Index
Journal :
Scientific Reports
Publication Type :
Academic Journal
Accession number :
113203731
Full Text :
https://doi.org/10.1038/srep21525
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