High sensitivity gamma radiation dosimetry using (In2O3)0.1 (TeO2)0.9 thin films.

The effects of gamma irradiation of various levels on the current-voltage characteristics for the (In₂O₃)_0.1 (TeO₂)_0.9 thin films, prepared by thermal evaporation in vacuum, have been studied in detail. The current increases linearly with the gamma radiation dose up to certain dose and decreases thereafter. The sensitivity of these thin films, at different applied voltages in the range 0-4.8 V, has been found to be in the range 35-190 mA/cm²/Gy. Correspondingly, the minimum measurable dose has been found to be in the range 0.05-0.26 mGy. The values of the sensitivity are reasonably high in comparison to the commercially available gamma radiation dosimeters, revealing high scope for further developments. [ABSTRACT FROM AUTHOR]