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Electron cyclotron resonance ion source plasma characterization by X-ray spectroscopy and X-ray imaging.
- Source :
- Review of Scientific Instruments; Feb2016, Vol. 87 Issue 2, p02A510-1-02A510-5, 5p, 1 Color Photograph, 1 Diagram, 1 Chart, 4 Graphs
- Publication Year :
- 2016
-
Abstract
- An experimental campaign aiming to investigate electron cyclotron resonance (ECR) plasma X-ray emission has been recently carried out at the ECRISs-Electron Cyclotron Resonance Ion Sources laboratory of Atomki based on a collaboration between the Debrecen and Catania ECR teams. In a first series, the X-ray spectroscopy was performed through silicon drift detectors and high purity germanium detectors, characterizing the volumetric plasma emission. The on-purpose developed collimation system was suitable for direct plasma density evaluation, performed "on-line" during beam extraction and charge state distribution characterization. A campaign for correlating the plasma density and temperature with the output charge states and the beam intensity for different pumping wave frequencies, different magnetic field profiles, and single-gas/gas-mixing configurations was carried out. The results reveal a surprisingly very good agreement between warm-electron density fluctuations, output beam currents, and the calculated electromagnetic modal density of the plasma chamber. A charge-coupled device camera coupled to a small pin-hole allowing X-ray imaging was installed and numerous X-ray photos were taken in order to study the peculiarities of the ECRIS plasma structure. [ABSTRACT FROM AUTHOR]
- Subjects :
- ION sources
CYCLOTRONS
X-ray reflection
PLASMA radiation
OSCILLATIONS
Subjects
Details
- Language :
- English
- ISSN :
- 00346748
- Volume :
- 87
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Review of Scientific Instruments
- Publication Type :
- Academic Journal
- Accession number :
- 113485722
- Full Text :
- https://doi.org/10.1063/1.4939201