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Performance trade-off for the Insulated Gate Bipolar Transistor: Buffer layer versus base lifetime reduction.

Authors :
Hefner, Allen R.
Blackburn, David L.
Source :
1986 17th Annual IEEE Power Electronics Specialists Conference; 1/1/1986, p27-38, 12p
Publication Year :
1986

Details

Language :
English
ISBNs :
9789996323270
Database :
Complementary Index
Journal :
1986 17th Annual IEEE Power Electronics Specialists Conference
Publication Type :
Conference
Accession number :
114301465
Full Text :
https://doi.org/10.1109/PESC.1986.7415543