Guest Editorial Special Issue on the 2015 IEEE International Instrumentation and Measurement Technology Conference Pisa, Italy, May 11–14, 2015.

The 32nd annual IEEE International Instrumentation and Measurement Technology Conference ( \textI^2 MTC) was held in historic and beautiful Pisa, Italy. The theme of the conference was “The Measurable of Tomorrow: Providing a Better Perspective on Complex Systems.” The first part of the title embraced the challenge of Galileo Galilei, “Measure what is measurable, and make measurable what is not so,” while the second part called for the instrumentation and measurement (I&M) community to face the increasing complexity of systems resulting from the continuous development of new technologies. [ABSTRACT FROM AUTHOR]