Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction.

Authors :: Merz, T. A.
Noad, H.
Xu, R.
Inoue, H.
Liu, W.
Hikita, Y.
Vailionis, A.
Moler, K. A.
Hwang, H. Y.
Source :: Applied Physics Letters; 5/2/2016, Vol. 108 Issue 18, p182901-1-182901-4, 4p, 2 Diagrams, 2 Graphs
Publication Year :: 2016
Abstract: We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO3. At 80K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x- and z-axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures. [ABSTRACT FROM AUTHOR]