In-Circuit Mutation-Based Automatic Correction of Certain Design Errors Using SAT Mechanisms.

Details

Language :

English

ISBNs :

9781467397391

Database :

Complementary Index

Journal :

2015 IEEE 24th Asian Test Symposium (ATS)

Publication Type :

Conference

Accession number :

115627339

Full Text :

https://doi.org/10.1109/ATS.2015.41