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Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs.
- Source :
- IEEE Transactions on Instrumentation & Measurement; Aug2016, Vol. 65 Issue 8, p1804-1817, 14p
- Publication Year :
- 2016
-
Abstract
- This paper presents a comprehensive investigation of several important error sources for the successive-approximation register (SAR) analog-to-digital converters (ADCs). The error sources that we discuss in this paper include the dynamic comparator offset, the dynamic gain error of digital-to-analog converter (DAC), the capacitor mismatch of capacitive DAC, the incomplete settling of DAC, the undershoot of reference voltage, and the input signal coupling. The integral/differential nonlinearities (INL/DNL) of SAR ADCs that are resulted from these error sources are analyzed and addressed. A diagnostic procedure is presented to identify the possible error sources based on the INL/DNL plots. In addition, design suggestions for overcoming these problems are also offered and recommended in this paper. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189456
- Volume :
- 65
- Issue :
- 8
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Instrumentation & Measurement
- Publication Type :
- Academic Journal
- Accession number :
- 116814479
- Full Text :
- https://doi.org/10.1109/TIM.2016.2562198