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Effect of platen shape on evolution of total thickness variation in single-sided lapping of sapphire wafer.

Authors :
Lee, Taekyung
Jeong, Haedo
Kim, Hyoungjae
Lee, Sangjik
Kim, Doyeon
Source :
International Journal of Precision Engineering & Manufacturing-Green Technology; Jul2016, Vol. 3 Issue 3, p225-229, 5p
Publication Year :
2016

Details

Language :
English
ISSN :
22886206
Volume :
3
Issue :
3
Database :
Complementary Index
Journal :
International Journal of Precision Engineering & Manufacturing-Green Technology
Publication Type :
Academic Journal
Accession number :
117463483
Full Text :
https://doi.org/10.1007/s40684-016-0029-z