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Prediction of thin liquid film evaporation characteristics with a thermal lattice boltzmann method.

Authors :
Weilin Yang
Li, Hongxia
Alhosani, Mohamed H.
Zhang, TieJun
Source :
2016 15th IEEE Intersociety Conference on Thermal & Thermomechanical Phenomena in Electronic Systems (ITherm); 2016, p1240-1247, 8p
Publication Year :
2016

Details

Language :
English
ISBNs :
9781467381215
Database :
Complementary Index
Journal :
2016 15th IEEE Intersociety Conference on Thermal & Thermomechanical Phenomena in Electronic Systems (ITherm)
Publication Type :
Conference
Accession number :
118391598
Full Text :
https://doi.org/10.1109/ITHERM.2016.7517689