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Possible Mechanism for Effects Caused by Exposure to Extremely Low Frequency Magnetic Fields.

Authors :
Gao, Yang
Zheng, Yu
Chen, Ruijuan
Wang, Hui-Quan
Dong, Lei
Dou, Junrong
Source :
IEEE Transactions on Magnetics; Dec2016, Vol. 52 Issue 12, p1-8, 8p
Publication Year :
2016

Abstract

This paper introduces a possible mechanism to explain the changes in neurons following extremely low frequency magnetic fields (ELF-MFs). The model in this paper contains two parts: the physical part and the bio-trigger part. The first part is an electric current equation, which is a generalization of the Nernst–Plank equation with the exposure of ELF-MF, and the second bio-part is a phenomenological model, which is a simple two-state channel with two steady state open (O) state and closed state (C). The two parts are complementary. The first part is utilized to explain changes about synaptic plasticity following ELF-MF exposure at embryonic and postnatal age. The second part is used to simulate the process of three different types of neurons reported by previous papers. According to the results, the present model is feasible for the simulation process. The concept of ion mobility or permeability is emphasized in this paper in part I, and channel state transition probabilities are paid much attention to in part II. In this paper, the ion mobility or permeability is supposed to have close relationships with ion channel transition probabilities, which connects the two parts of the model together. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189464
Volume :
52
Issue :
12
Database :
Complementary Index
Journal :
IEEE Transactions on Magnetics
Publication Type :
Academic Journal
Accession number :
119593229
Full Text :
https://doi.org/10.1109/TMAG.2016.2594284