Back to Search Start Over

Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm.

Authors :
Thanh Hung Dinh
Yoshiki Kondo
Toshiki Tamura
Yuichi Ono
Hiroyuki Hara
Hiroki Oikawa
Yoichi Yamamoto
Masahiko Ishino
Masaharu Nishikino
Tetsuya Makimura
Padraig Dunne
Gerry O'Sullivan
Shigeru Ohta
Ken Kitano
Takeo Ejima
Tadashi Hatano
Takeshi Higashiguchi
Source :
Review of Scientific Instruments; Dec2016, Vol. 87 Issue 12, p1-7, 7p, 1 Diagram, 7 Graphs
Publication Year :
2016

Abstract

A flat-field grazing incidence spectrometer operating on the spectral region from 1 to 10 nm was built for research on physics of high temperature and high energy density plasmas. It consists of a flat-field grating with 2400 lines/mm as a dispersing element and an x-ray charged coupled device (CCD) camera as the detector. The diffraction efficiency of the grating and the sensitivity of the CCD camera were directly measured by use of synchrotron radiation at the BL-11D beamline of the Photon Factory (PF). The influence of contamination to the spectrometer also was characterized. This result enables us to evaluate the absolute number of photons in a wide range wavelength between 1 and 10 nm within an acquisition. We obtained absolutely calibrated spectra from highly charged ion plasmas of Gd, from which a maximum energy conversion efficiency of 0.26% was observed at a Nd:YAG laser intensity of 3 × 10<superscript>12</superscript> W/cm². [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00346748
Volume :
87
Issue :
12
Database :
Complementary Index
Journal :
Review of Scientific Instruments
Publication Type :
Academic Journal
Accession number :
120465469
Full Text :
https://doi.org/10.1063/1.4971421