Research on reliability assessment of space electronic products based on integration of highly accelerated life test and accelerated degradation test.

Details

Language :

English

ISBNs :

9781509036653

Database :

Complementary Index

Journal :

2016 IEEE International Conference on Industrial Engineering & Engineering Management (IEEM)

Publication Type :

Conference

Accession number :

120874350

Full Text :

https://doi.org/10.1109/IEEM.2016.7798157