Phase field modelling on the growth dynamics of double voids of different sizes during czochralski silicon crystal growth.

Details

Language :

English

ISSN :

17578981

Volume :

170

Issue :

1

Database :

Complementary Index

Journal :

IOP Conference Series: Materials Science & Engineering

Publication Type :

Academic Journal

Accession number :

121325019

Full Text :

https://doi.org/10.1088/1757-899X/170/1/012020