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Erratum to “Design Issues for Performance Enhancement in Nanostructured Silicon Oxide Biosensors: Modeling the Frequency Response”.
- Source :
- IEEE Transactions on Electron Devices; Mar2017, Vol. 64 Issue 3, p1408-1408, 1p
- Publication Year :
- 2017
-
Abstract
- The authors would like to make corrections to <xref ref-type="bibr" rid="ref1">[1, Fig. 7(b) and (c)]</xref> due to some post-processing carried out in these figures. After capturing the SEM images—top view [<xref rid="fig7" ref-type="fig">Fig. 7(b)</xref>] and cross section [<xref rid="fig7" ref-type="fig">Fig. 7(c)</xref>] in <xref ref-type="bibr" rid="ref1">[1]</xref>, we started measuring the pore dimensions with image processing software. We wanted to measure both the lateral and the vertical diameters of the pores in <xref rid="fig7" ref-type="fig">Fig. 7(b)</xref> (since they are not exactly circular). For this purpose, a boundary was constructed around some of the pores with textured lines but mistakenly these lines were not removed during transferring the pictures to the manuscript, which is responsible for the distortion in <xref ref-type="bibr" rid="ref1">[1, Fig. 7(b)]</xref>. In <xref rid="fig7" ref-type="fig">Fig. 7(c)</xref> also, we wanted to measure the pore length, for which textured lines were drawn along the length of the pore, leading to some changes in the color contrast at the mouth of the pore from the original SEM picture. These lines also should have been removed from <xref ref-type="bibr" rid="ref1">[1, Fig. 7(c)]</xref>. [ABSTRACT FROM AUTHOR]
- Subjects :
- BIOSENSORS
NANOSILICON
SCANNING electron microscopy
Subjects
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 64
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- 121551497
- Full Text :
- https://doi.org/10.1109/TED.2017.2654502