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X-Ray Diffraction Study of CeT2Al10 (T = Ru, Os) at Low Temperatures and under Pressures.
- Source :
- Acta Physica Polonica: A; 2017, Vol. 131 Issue 4, p988-990, 3p
- Publication Year :
- 2017
-
Abstract
- We have carried out a powder X-ray diffraction investigation on antiferromagnetic Kondo semiconductors CeRu<subscript>2</subscript>A<subscript>l10</subscript> and CeOs<subscript>2</subscript>A<subscript>l10</subscript> at low temperatures and under high pressures as well as the structural investigation on single crystal of these compounds. The results of powder X-ray studies of CeRu<subscript>2</subscript>A<subscript>l10</subscript> and CeOs<subscript>2</subscript>A<subscript>10</subscript> indicate that these compounds do not have structural transition at its antiferromagnetic ordering temperature. The results of single crystal structural refinement indicate that the b-axis of this crystal structure is insensitive not only to pressure but also to temperature and that the effect of cooling to Ce-Ce distance for CeRu<subscript>2</subscript>A<subscript>10</subscript> is the same as that for CeOs<subscript>2</subscript>A<subscript>l10</subscript>. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 05874246
- Volume :
- 131
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- Acta Physica Polonica: A
- Publication Type :
- Academic Journal
- Accession number :
- 123105346
- Full Text :
- https://doi.org/10.12693/APhysPolA.131.988