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X-Ray Diffraction Study of CeT2Al10 (T = Ru, Os) at Low Temperatures and under Pressures.

Authors :
KAWAMURA, Y.
HAYASHI, J.
TAKEDA, K.
SEKINE, C.
TANIDA, H.
SERA, M.
NAKANO, S.
TOMITA, T.
TAKAHASHI, H.
NISHIOKA, T.
Source :
Acta Physica Polonica: A; 2017, Vol. 131 Issue 4, p988-990, 3p
Publication Year :
2017

Abstract

We have carried out a powder X-ray diffraction investigation on antiferromagnetic Kondo semiconductors CeRu<subscript>2</subscript>A<subscript>l10</subscript> and CeOs<subscript>2</subscript>A<subscript>l10</subscript> at low temperatures and under high pressures as well as the structural investigation on single crystal of these compounds. The results of powder X-ray studies of CeRu<subscript>2</subscript>A<subscript>l10</subscript> and CeOs<subscript>2</subscript>A<subscript>10</subscript> indicate that these compounds do not have structural transition at its antiferromagnetic ordering temperature. The results of single crystal structural refinement indicate that the b-axis of this crystal structure is insensitive not only to pressure but also to temperature and that the effect of cooling to Ce-Ce distance for CeRu<subscript>2</subscript>A<subscript>10</subscript> is the same as that for CeOs<subscript>2</subscript>A<subscript>l10</subscript>. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
05874246
Volume :
131
Issue :
4
Database :
Complementary Index
Journal :
Acta Physica Polonica: A
Publication Type :
Academic Journal
Accession number :
123105346
Full Text :
https://doi.org/10.12693/APhysPolA.131.988