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An empirical equation for prediction of silicon wafer deformation.

Authors :
Xianglong Zhu
Xiuyi Chen
Haijun Liu
Renke Kang
Bi Zhang
Zhigang Dong
Source :
Materials Research Express; Jun2017, Vol. 4 Issue 6, p1-1, 1p
Publication Year :
2017

Details

Language :
English
ISSN :
20531591
Volume :
4
Issue :
6
Database :
Complementary Index
Journal :
Materials Research Express
Publication Type :
Academic Journal
Accession number :
123902377
Full Text :
https://doi.org/10.1088/2053-1591/aa71ed