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Reliable Hardware Architectures for Cryptographic Block Ciphers LED and HIGHT.

Authors :
Subramanian, Srivatsan
Mozaffari-Kermani, Mehran
Azarderakhsh, Reza
Nojoumian, Mehrdad
Source :
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Oct2017, Vol. 36 Issue 10, p1750-1758, 9p
Publication Year :
2017

Abstract

Cryptographic architectures provide different security properties to sensitive usage models. However, unless reliability of architectures is guaranteed, such security properties can be undermined through natural or malicious faults. In this paper, two underlying block ciphers which can be used in authenticated encryption algorithms are considered, i.e., light encryption device and high security and lightweight block ciphers. The former is of the Advanced Encryption Standard type and has been considered area-efficient, while the latter constitutes a Feistel network structure and is suitable for low-complexity and low-power embedded security applications. In this paper, we propose efficient error detection architectures including variants of recomputing with encoded operands and signature-based schemes to detect both transient and permanent faults. Authenticated encryption is applied in cryptography to provide confidentiality, integrity, and authenticity simultaneously to the message sent in a communication channel. In this paper, we show that the proposed schemes are applicable to the case study of simple lightweight CFB for providing authenticated encryption with associated data. The error simulations are performed using Xilinx Integrated Synthesis Environment tool and the results are benchmarked for the Xilinx FPGA family Virtex-7 to assess the reliability capability and efficiency of the proposed architectures. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
02780070
Volume :
36
Issue :
10
Database :
Complementary Index
Journal :
IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
Publication Type :
Academic Journal
Accession number :
125245905
Full Text :
https://doi.org/10.1109/TCAD.2017.2661811