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Integrated Test System of Infrared and Laser Data Based on USB 3.0.

Authors :
Hui Quan Fu
Lin Bo Tang
Chao Zhang
Bao Jun Zhao
Mao Wen Li
Source :
Proceedings of SPIE; 7/21/2017, Vol. 10420, p1-8, 8p
Publication Year :
2017

Details

Language :
English
ISSN :
0277786X
Volume :
10420
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
125365149
Full Text :
https://doi.org/10.1117/12.2281653