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STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2.
- Source :
- Microscopy & Microanalysis; 2017 Special issue, Vol. 23, p1428-1429, 2p, 1 Graph
- Publication Year :
- 2017
Details
- Language :
- English
- ISSN :
- 14319276
- Volume :
- 23
- Database :
- Complementary Index
- Journal :
- Microscopy & Microanalysis
- Publication Type :
- Academic Journal
- Accession number :
- 126003888
- Full Text :
- https://doi.org/10.1017/S1431927617007802