Contact effects analyzed by a parameter extraction method based on a single bottom-gate/top-contact organic thin-film transistor.

MLA

Shunsuke Takagaki, et al. “Contact Effects Analyzed by a Parameter Extraction Method Based on a Single Bottom-Gate/Top-Contact Organic Thin-Film Transistor.” Japanese Journal of Applied Physics, vol. 57, no. 3S2, Mar. 2018, p. 1. EBSCOhost, https://doi.org/10.7567/JJAP.57.03EH04.

APA

Shunsuke Takagaki, Hirofumi Yamada, & Kei Noda. (2018). Contact effects analyzed by a parameter extraction method based on a single bottom-gate/top-contact organic thin-film transistor. Japanese Journal of Applied Physics, 57(3S2), 1. https://doi.org/10.7567/JJAP.57.03EH04

Chicago

Shunsuke Takagaki, Hirofumi Yamada, and Kei Noda. 2018. “Contact Effects Analyzed by a Parameter Extraction Method Based on a Single Bottom-Gate/Top-Contact Organic Thin-Film Transistor.” Japanese Journal of Applied Physics 57 (3S2): 1. doi:10.7567/JJAP.57.03EH04.