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Thickness driven spin reorientation transition of epitaxial LaCrO3 films.
- Source :
- Applied Physics Letters; 3/12/2018, Vol. 112 Issue 11, p1-1, 1p, 3 Graphs
- Publication Year :
- 2018
-
Abstract
- We grew fully strained epitaxial LaCrO<subscript>3</subscript> (LCO) films on SrTiO<subscript>3</subscript>(001) under layer-by-layer control up to the film thickness of <italic>t</italic> = 130 nm using a pulsed laser deposition method. The spin axis of the antiferromagnetic LCO film was systematically examined as a function of <italic>t</italic> by using Cr <italic>L</italic><subscript>2,3</subscript>-edge x-ray magnetic linear dichroism (XMLD). The XMLD results manifest a spin reorientation transition (SRT) across a transition thickness of <italic>t<subscript>T</subscript></italic> ∼ 60 nm. This SRT is well explained in terms of two competing magnetic anisotropy energies of the surface/interface (<italic>K<subscript>S</subscript></italic>) and the LCO film itself (<italic>K<subscript>V</subscript></italic>). [ABSTRACT FROM AUTHOR]
- Subjects :
- EPITAXY
PULSED laser deposition
ANTIFERROMAGNETIC materials
DICHROISM
THIN films
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 112
- Issue :
- 11
- Database :
- Complementary Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 128520027
- Full Text :
- https://doi.org/10.1063/1.5021950