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Reduced contact resistance of a-IGZO thin film transistors with inkjet-printed silver electrodes.
- Source :
- Journal of Physics D: Applied Physics; 4/25/2018, Vol. 51 Issue 16, p1-1, 1p
- Publication Year :
- 2018
-
Abstract
- In this study, high performance amorphous In–Ga–Zn–O (a-IGZO) TFTs were successfully fabricated with inkjet-printed silver source-drain electrodes. The results showed that increased channel thickness has an improving trend in the properties of TFTs due to the decreased contact resistance. Compared with sputtered silver TFTs, devices with printed silver electrodes were more sensitive to the thickness of active layer. Furthermore, the devices with optimized active layer showed high performances with a maximum saturation mobility of 8.73 cm<superscript>2</superscript> · V<superscript>−1</superscript> · S<superscript>−1</superscript> and an average saturation mobility of 6.97 cm<superscript>2</superscript> · V<superscript>−1</superscript> · S<superscript>−1</superscript>, I<subscript>on</subscript>/I<subscript>off</subscript> ratio more than 10<superscript>7</superscript> and subthreshold swing of 0.28 V/decade, which were comparable with the analogous devices with sputtered electrodes. [ABSTRACT FROM AUTHOR]
- Subjects :
- THIN film transistors
CONTACT resistance (Materials science)
ELECTRODES
Subjects
Details
- Language :
- English
- ISSN :
- 00223727
- Volume :
- 51
- Issue :
- 16
- Database :
- Complementary Index
- Journal :
- Journal of Physics D: Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 128870447
- Full Text :
- https://doi.org/10.1088/1361-6463/aab4b9