Optical characterization and bandgap engineering of flat and wrinkle-textured FA0.83Cs0.17Pb(I1–<italic>x</italic>Br<italic>x</italic>)3 perovskite thin films.

The complex refractive indices of formamidinium cesium lead mixed-halide [FA_0.83Cs_0.17Pb(I_{1–<italic>x</italic>}Br_{<italic>x</italic>})₃] perovskite thin films of compositions ranging from <italic>x</italic> = 0 to 0.4, with both flat and wrinkle-textured surface topographies, are reported. The films are characterized using a combination of variable angle spectroscopic ellipsometry and spectral transmittance in the wavelength range of 190 nm to 850 nm. Optical constants, film thicknesses and roughness layers are obtained point-by-point by minimizing a global error function, without using optical dispersion models, and including topographical information supplied by a laser confocal microscope. To evaluate the bandgap engineering potential of the material, the optical bandgaps and Urbach energies are then accurately determined by applying a band fluctuation model for direct semiconductors, which considers both the Urbach tail and the fundamental band-to-band absorption region in a single equation. With this information, the composition yielding the optimum bandgap of 1.75 eV for a Si-perovskite tandem solar cell is determined. [ABSTRACT FROM AUTHOR]