Back to Search Start Over

The high‐intensity reflectometer of the Jülich Centre for Neutron Science: MARIA.

Authors :
Mattauch, Stefan
Koutsioubas, Alexandros
Rücker, Ulrich
Korolkov, Denis
Fracassi, Vicenzo
Daemen, Jos
Schmitz, Ralf
Bussmann, Klaus
Suxdorf, Frank
Wagener, Michael
Kämmerling, Peter
Kleines, Harald
Fleischhauer-Fuß, Lydia
Bednareck, Manfred
Ossoviy, Vladimir
Nebel, Andreas
Stronciwilk, Peter
Staringer, Simon
Gödel, Marko
Richter, Alfred
Source :
Journal of Applied Crystallography; Jun2018, Vol. 51 Issue 3, p646-654, 8p
Publication Year :
2018

Abstract

MARIA (magnetism reflectometer with high incident angle) is a world class vertical sample reflectometer dedicated to the investigation of thin films in the fields of magnetism, soft matter and biology. The elliptical vertically focusing guide allows one to measure small samples with a typical size of 1 × 1 cm very efficiently. The double‐bounce polarizer and the in situ pumped <superscript>3</superscript>He SEOP (spin‐exchange optical pumping) neutron spin filter cell for analysing the polarization of the reflected neutron beam can be moved into the beam in seconds. The polarized flux of MARIA amounts to 5 × 10<superscript>7</superscript> n (s cm<superscript>2</superscript>)<superscript>−1</superscript> at the sample position with a horizontally collimated beam of 3 mrad, a wavelength of λ = 4.5 Å and a wavelength resolution of Δλ/λ = 10%. In the non‐polarized mode a flux of 1.2 × 10<superscript>8</superscript> n (s cm<superscript>2</superscript>)<superscript>−1</superscript> is achieved in this configuration. MARIA is also capable of grazing‐incidence small‐angle neutron scattering measurements, using a pinhole collimation with two four‐segment slits and an absorber that prevents the focusing of the elliptical guide in the vertical direction. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218898
Volume :
51
Issue :
3
Database :
Complementary Index
Journal :
Journal of Applied Crystallography
Publication Type :
Academic Journal
Accession number :
130000789
Full Text :
https://doi.org/10.1107/S1600576718006994