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Effects of dopant ions on the conductivity of Ce0.75Sm0.2M0.05O1.875 (M = Al, Fe, Y, Bi) electrolytes.
- Source :
- Journal of Materials Science: Materials in Electronics; Jul2018, Vol. 29 Issue 14, p12429-12435, 7p
- Publication Year :
- 2018
-
Abstract
- In this paper, the relationship between the phase purity, microstructure, conductivity and thermal expansion of the M (Al, Fe, Y and Bi) doped SDC (Ce<subscript>0.8</subscript>Sm<subscript>0.2</subscript>O<subscript>1.9</subscript>) electrolytes was investigated. Ce<subscript>0.75</subscript>Sm<subscript>0.2</subscript>M<subscript>0.05</subscript>O<subscript>1.875</subscript> (M = Al, Fe, Y, Bi) electrolytes were prepared by sol-gel auto-combustion process. From XRD analysis, the dopant ions (Al, Fe, Y and Bi) are doped in the lattice of cubic fluorite structure of SDC and no second phase is formed for Ce<subscript>0.75</subscript>Sm<subscript>0.2</subscript>M<subscript>0.05</subscript>O<subscript>1.875</subscript> (M = Al, Fe, Y, Bi) calcined at 700 °C for 4 h. However, the impurity phase of Ce<subscript>2</subscript>O<subscript>3</subscript> is formed for Ce<subscript>0.75</subscript>Sm<subscript>0.2</subscript>Al<subscript>0.05</subscript>O<subscript>1.875</subscript> sintered at 1400 °C for 4 h. Moreover, the relative densities of the samples increase after doped with Fe, Y and Bi. While Al doping cannot improve the sintering performance and decreases the density. These results are consistent with the SEM images. In addition, the grain size of Ce<subscript>0.75</subscript>Sm<subscript>0.2</subscript>Bi<subscript>0.05</subscript>O<subscript>1.875</subscript> is the largest as indicated by SEM microstructure. More importantly, the average thermal expansion coefficient and ionic conductivity of the sintered samples improves after doped with Fe, Y and Bi, which suggests that Ce<subscript>0.75</subscript>Sm<subscript>0.2</subscript>M<subscript>0.05</subscript>O<subscript>1.875</subscript> (M = Al, Fe, Y, Bi) can be a potential electrolyte for the IT-SOFC. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 09574522
- Volume :
- 29
- Issue :
- 14
- Database :
- Complementary Index
- Journal :
- Journal of Materials Science: Materials in Electronics
- Publication Type :
- Academic Journal
- Accession number :
- 130276782
- Full Text :
- https://doi.org/10.1007/s10854-018-9359-7