Neutron Reflectometry Studies of ZnO Films.

Authors :: Zhaketov, V. D.
Chitanu, E.
Nikitenko, Yu. V.
Source :: Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Jul2018, Vol. 12 Issue 4, p658-664, 7p
Publication Year :: 2018
Abstract: Textured Al-doped ZnO films are studied using neutron reflectometry. The films are quasiperiodic structures with a period of several nanometers. The films are inhomogeneous in a surface layer with a thickness of 10-20 nm. [ABSTRACT FROM AUTHOR]

Language :: English
ISSN :: 10274510
Volume :: 12
Issue :: 4
Database :: Complementary Index
Journal :: Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques
Publication Type :: Academic Journal
Accession number :: 131114733
Full Text :: https://doi.org/10.1134/S1027451018040195