Event-Based Modeling and Analysis of Sensor Enabled Networked Manufacturing Systems.

Mathematical models are often required in process modeling, control, and evaluation. To meet the increasing demand of production system real-time performance evaluation and improvement, in this paper: 1) an innovative event-based, data-driven mathematical model is established for network structured manufacturing systems; 2) important properties of network structured manufacturing systems are obtained through the concept development of a virtual ideal clean system; and 3) a system performance diagnostic method is developed based on the mathematical model and system properties, as well as available sensor data. The mathematical model and system performance identification methodology are studied analytically and validated by simulation studies. This data-driven mathematical framework and system real-time performance diagnostic methodology are invaluable for real-time production control to improve system responsiveness and efficiency. Note to Practitioners—For production systems with complex networked structure layouts, the dependence relationship between machines and buffers is more complicated compared with serial production lines. Therefore, it is more difficult to analyze and evaluate their real-time production performance such as permanent production loss. Such information is critical for real-time production management and control to achieve higher system responsiveness and efficiency. This paper establishes an event-based data-driven mathematical model to describe the real-time dynamic behavior of manufacturing systems with complex networked structures. Furthermore, an analysis method for networked manufacturing system properties and a data-driven system performance diagnostic method are proposed. The methods provide a quantitative solution to evaluate production capacity and production constraints of complex networked manufacturing systems, and to evaluate the system real-time performance such as permanent production loss and its attribution to each disruption event and machine. [ABSTRACT FROM AUTHOR]