Cite
The Demonstration of Increased Selectivity During Experimental Measurement in Filament-Type Vanadium Oxide-Based Selector.
MLA
Chen, Chun-Kuei, et al. “The Demonstration of Increased Selectivity During Experimental Measurement in Filament-Type Vanadium Oxide-Based Selector.” IEEE Transactions on Electron Devices, vol. 65, no. 10, Oct. 2018, pp. 4622–27. EBSCOhost, https://doi.org/10.1109/TED.2018.2862917.
APA
Chen, C.-K., Lin, C.-Y., Chen, P.-H., Chang, T.-C., Shih, C.-C., Tseng, Y.-T., Zheng, H.-X., Chen, Y.-C., Chang, Y.-F., Lin, C.-C., Huang, H.-C., Huang, W.-C., Wang, H., & Sze, S. M. (2018). The Demonstration of Increased Selectivity During Experimental Measurement in Filament-Type Vanadium Oxide-Based Selector. IEEE Transactions on Electron Devices, 65(10), 4622–4627. https://doi.org/10.1109/TED.2018.2862917
Chicago
Chen, Chun-Kuei, Chih-Yang Lin, Po-Hsun Chen, Ting-Chang Chang, Chih-Cheng Shih, Yi-Ting Tseng, Hao-Xuan Zheng, et al. 2018. “The Demonstration of Increased Selectivity During Experimental Measurement in Filament-Type Vanadium Oxide-Based Selector.” IEEE Transactions on Electron Devices 65 (10): 4622–27. doi:10.1109/TED.2018.2862917.