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X-Band Power and Linearity Performance of Compositionally Graded AlGaN Channel Transistors.

Authors :
Sohel, Shahadat H.
Xie, Andy
Beam, Edward
Xue, Hao
Roussos, Jason A.
Razzak, Towhidur
Bajaj, Sanyam
Cao, Yu
Meyer, David J.
Lu, Wu
Rajan, Siddharth
Source :
IEEE Electron Device Letters; Dec2018, Vol. 39 Issue 12, p1884-1887, 4p
Publication Year :
2018

Abstract

We report on the power and linearity performance of metal organic chemical vapor deposition grown AlGaN channel polarization-graded field-effect transistor (PolFET). The fabricated transistors with 3-D electron channels showed nearly flat transconductance profiles. Maximum ${f}_{T}$ and ${f}_{\text {max}}$ of 23 and 65 GHz were measured for 0.7- $\mu \text{m}$ gate-length transistors, corresponding to an ${f}_{T}$ - ${L}_{G}$ product of 16.2 GHz $\cdot \mu \text{m}$. Load-pull measurement at 10 GHz revealed a maximum output power of 2 W/mm with a maximum small signal gain of 16 dB. Two-tone measurement at 10 GHz showed an OIP3 of 33 dBm for 150- $\mu \text{m}$ device width and a corresponding linearity figure-of-merit OIP3/ $\text{P}_{\text {DC}}$ of 3.4 dB. These results suggest that PolFETs could be useful for high-frequency applications requiring high linearity. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07413106
Volume :
39
Issue :
12
Database :
Complementary Index
Journal :
IEEE Electron Device Letters
Publication Type :
Academic Journal
Accession number :
133261692
Full Text :
https://doi.org/10.1109/LED.2018.2874443