Investigation of Surface Plasmon Resonance in the Rectangular Cavity of Ag-Si-SiO2.

In this paper, the surface plasmon resonance (SPR) of rectangular cavity is investigated in Ag-Si-SiO₂ under near-infrared light incident by finite-difference time-domain (FDTD). Between the surface plasma and the thickness of the silver film, the length of the silver film, the thickness of silicon, and the position of silicon, these relationships will be studied in a rectangular cavity, which is surrounded by silver film, two rectangular nanoscale silicons, and silicon dioxide. The surface plasmon resonance of the RCM is independent of the distance between the two silicons when the transverse silver film length l is fixed and of height d = 10k (k = 1, 2, 3, 4, and 5) nm of rectangular silicon and thickness t (t = 6, 7, 8, 9, 10, 11, and 12 nm) of silver film while the length l = 600 nm. The SPR is a lateral length dependence of silver film. The plasma resonance of the two first-order modes is distributed symmetrically on both sides of the local field in RCM, and it is irrelevant with the position of the vibration mode and the thickness of the silver film. On the basis of the above research, we propose to create a guided-wave resonance that can be directly observed from the normal incidence transmission spectra and electric field distribution. This structure can be used as a highly tunable optical sensitive element that can be tuned with a small change of transverse silver film length. [ABSTRACT FROM AUTHOR]