Research of X-ray induced single event soft errors in 45 nm SRAM.

MLA

Yang Zhang, et al. “Research of X-Ray Induced Single Event Soft Errors in 45 Nm SRAM.” Japanese Journal of Applied Physics, vol. 58, no. 1, Jan. 2019, p. 1. EBSCOhost, https://doi.org/10.7567/1347-4065/aae9f6.

APA

Yang Zhang, Hong-Xia Guo, Feng-Qi Zhang, Jia-Nan Wei, Yan Liu, Jian-Hui Luo, Yu-Fang Liang, & Li Qin. (2019). Research of X-ray induced single event soft errors in 45 nm SRAM. Japanese Journal of Applied Physics, 58(1), 1. https://doi.org/10.7567/1347-4065/aae9f6

Chicago

Yang Zhang, Hong-Xia Guo, Feng-Qi Zhang, Jia-Nan Wei, Yan Liu, Jian-Hui Luo, Yu-Fang Liang, and Li Qin. 2019. “Research of X-Ray Induced Single Event Soft Errors in 45 Nm SRAM.” Japanese Journal of Applied Physics 58 (1): 1. doi:10.7567/1347-4065/aae9f6.