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Embedded Near-Infrared Sensor With Tunable Sensitivity for Nanoscale CMOS Technologies.

Authors :
Chen, Zih-Hong
Huang, Po-Hsiang
Wang, Chein-Ping
Chih, Yu-Der
Lin, Chrong-Jung
King, Ya-Chin
Source :
IEEE Sensors Journal; 2/1/2019, Vol. 19 Issue 3, p933-939, 7p
Publication Year :
2019

Abstract

Near-infrared (NIR) sensors has become one of the key components in applications, such as temperature, proximity, and even fingerprint sensing. A novel full-CMOS (Complementary Metal-Oxide-Semiconductor) compatible near-infrared sensor is proposed and demonstrated in this article. This sensing device consists of a gateless transistor, enabling near-infrared photon absorption in the channel region. With a tunable channel barrier, this near-IR sensor also features a dynamic photo-response with an extending sensing range up to 60 dB. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
1530437X
Volume :
19
Issue :
3
Database :
Complementary Index
Journal :
IEEE Sensors Journal
Publication Type :
Academic Journal
Accession number :
134123126
Full Text :
https://doi.org/10.1109/JSEN.2018.2880414