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Embedded Near-Infrared Sensor With Tunable Sensitivity for Nanoscale CMOS Technologies.
- Source :
- IEEE Sensors Journal; 2/1/2019, Vol. 19 Issue 3, p933-939, 7p
- Publication Year :
- 2019
-
Abstract
- Near-infrared (NIR) sensors has become one of the key components in applications, such as temperature, proximity, and even fingerprint sensing. A novel full-CMOS (Complementary Metal-Oxide-Semiconductor) compatible near-infrared sensor is proposed and demonstrated in this article. This sensing device consists of a gateless transistor, enabling near-infrared photon absorption in the channel region. With a tunable channel barrier, this near-IR sensor also features a dynamic photo-response with an extending sensing range up to 60 dB. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 1530437X
- Volume :
- 19
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- IEEE Sensors Journal
- Publication Type :
- Academic Journal
- Accession number :
- 134123126
- Full Text :
- https://doi.org/10.1109/JSEN.2018.2880414