Diagnostic Test Generation That Addresses Diagnostic Holes.

A diagnostic test generation procedure targets fault pairs in a set of target faults with the goal of distinguishing all the fault pairs. When a fault pair cannot be distinguished, it prevents the diagnostic test set from providing information about the faults, and consequently, about defects whose diagnosis would have benefited from a diagnostic test for the indistinguishable fault pair. This is referred to in this paper as a diagnostic hole. This paper observes that it is possible to address diagnostic holes by targeting different but related fault pairs, possibly from a different fault model. As an example, this paper considers the case where diagnostic test generation is carried out for single stuck-at faults, and related bridging faults are used for addressing diagnostic holes. Considering fault detection, an undetectable single stuck-at fault implies that certain related bridging faults are undetectable. This paper observes that, even if a pair of single stuck-at faults is indistinguishable, a related pair of bridging faults may be distinguishable. Based on this observation, diagnostic tests for pairs of bridging faults are added to a diagnostic test set when the related single stuck-at faults are indistinguishable. Experimental results of defect diagnosis for defects that do not involve bridging faults demonstrate the importance of eliminating diagnostic holes. [ABSTRACT FROM AUTHOR]