Fast Differential Phase-Contrast Imaging and Total Fluorescence Yield Mapping in a Hard X-ray Fluorescence Microprobe.

MLA

Vogt, S., et al. “Fast Differential Phase-Contrast Imaging and Total Fluorescence Yield Mapping in a Hard X-Ray Fluorescence Microprobe.” AIP Conference Proceedings, vol. 705, no. 1, Apr. 2004, pp. 1348–51. EBSCOhost, https://doi.org/10.1063/1.1758051.

APA

Vogt, S., Feser, M., Legnini, D., Kirz, J., Maser, J., & Warwick, T. (2004). Fast Differential Phase-Contrast Imaging and Total Fluorescence Yield Mapping in a Hard X-ray Fluorescence Microprobe. AIP Conference Proceedings, 705(1), 1348–1351. https://doi.org/10.1063/1.1758051

Chicago

Vogt, S., M. Feser, D. Legnini, J. Kirz, J. Maser, and T. Warwick. 2004. “Fast Differential Phase-Contrast Imaging and Total Fluorescence Yield Mapping in a Hard X-Ray Fluorescence Microprobe.” AIP Conference Proceedings 705 (1): 1348–51. doi:10.1063/1.1758051.