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Impact of Cell Topology on Characteristics of 600V 4H-SiC Planar MOSFETs.
- Source :
- IEEE Electron Device Letters; May2019, Vol. 40 Issue 5, p773-776, 4p
- Publication Year :
- 2019
-
Abstract
- This letter compares the measured electrical characteristics of 600 V planar-gate inversion-channel 4H-SiC power MOSFETs fabricated with four different cell topologies (Linear, Square, Hexagonal, and Octagonal) for the first time. The High-Frequency Figures-of-Merit (HF-FOMs) of these devices were compared with the commercially available SiC device and the Si CoolMOS product. It was found that the HF-FOMs of the 600-V SiC product and our fabricated conventional Linear cell device are much worse in comparison to the Si CoolMOS product. However, the 600 V SiC power MOSFET with comparable performance to the Si CoolMOS product could be achieved by using the Octagonal cell topology. [ABSTRACT FROM AUTHOR]
- Subjects :
- METAL oxide semiconductor field-effect transistors
TOPOLOGY
CELLS
LOGIC circuits
Subjects
Details
- Language :
- English
- ISSN :
- 07413106
- Volume :
- 40
- Issue :
- 5
- Database :
- Complementary Index
- Journal :
- IEEE Electron Device Letters
- Publication Type :
- Academic Journal
- Accession number :
- 136117376
- Full Text :
- https://doi.org/10.1109/LED.2019.2908078