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Fast and robust deconvolution of tumor infiltrating lymphocyte from expression profiles using least trimmed squares.
- Source :
- PLoS Computational Biology; 5/6/2019, Vol. 15 Issue 5, p1-21, 21p, 2 Charts, 6 Graphs
- Publication Year :
- 2019
-
Abstract
- Gene-expression deconvolution is used to quantify different types of cells in a mixed population. It provides a highly promising solution to rapidly characterize the tumor-infiltrating immune landscape and identify cold cancers. However, a major challenge is that gene-expression data are frequently contaminated by many outliers that decrease the estimation accuracy. Thus, it is imperative to develop a robust deconvolution method that automatically decontaminates data by reliably detecting and removing outliers. We developed a new machine learning tool, ast nd obust convolution of xpression rofiles (FARDEEP), to enumerate immune cell subsets from whole tumor tissue samples. To reduce noise in the tumor gene expression datasets, FARDEEP utilizes an adaptive least trimmed square to automatically detect and remove outliers before estimating the cell compositions. We show that FARDEEP is less susceptible to outliers and returns a better estimation of coefficients than the existing methods with both numerical simulations and real datasets. FARDEEP provides an estimate related to the absolute quantity of each immune cell subset in addition to relative percentages. Hence, FARDEEP represents a novel robust algorithm to complement the existing toolkit for the characterization of tissue-infiltrating immune cell landscape. The source code for FARDEEP is implemented in R and available for download at . [ABSTRACT FROM AUTHOR]
- Subjects :
- GENE expression
CYTOLOGY
IMMUNOLOGY
MACHINE learning
PROTEIN microarrays
Subjects
Details
- Language :
- English
- ISSN :
- 1553734X
- Volume :
- 15
- Issue :
- 5
- Database :
- Complementary Index
- Journal :
- PLoS Computational Biology
- Publication Type :
- Academic Journal
- Accession number :
- 136246663
- Full Text :
- https://doi.org/10.1371/journal.pcbi.1006976