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a-Si:H TFT-based gate driver circuit using Q node as both pull-up and hold-down controller.

Authors :
Jongsu Oh
Jin-Ho Kim
Kyung-Mo Jung
Hyo Eun Kim
Kyoung-Rae Kim
KeeChan Park
Jae-Hong Jeon
Yong-Sang Kim
Source :
Semiconductor Science & Technology; Jun2019, Vol. 34 Issue 6, p1-1, 1p
Publication Year :
2019

Abstract

We propose a new gate driver circuit, in which the Q node can be operated as a pull-up either as a hold-down controller. The number of transistors for the QB nodes is reduced because the one QB node can be replaced by the pull-up unit of the Q node. With an additional V<subscript>OUT</subscript> pull-down unit designed using only two transistors and one capacitance, we can control the discharge interval of the V<subscript>OUT</subscript> node to 100% duty ratio. Despite the simplified circuit configuration, the V<subscript>OUT</subscript> characteristic is almost the same as that of a conventional circuit with an AC-driven structure using one Q node, and two or more QB nodes. Our simulation results show that the V<subscript>H</subscript> voltage operates at +28 V from the 1071st to 1080th V<subscript>OUT</subscript> and the rising/falling time is less than 1 μs. To verify the reliability of this circuit, we further confirmed the V<subscript>OUT</subscript> according to the change in the threshold voltage (V<subscript>TH</subscript>). The proposed circuit can be operated even when the V<subscript>TH</subscript> is shifted to +20.5 V from the initial value (V<subscript>TH</subscript> = +1.09 V). Further, the V<subscript>OUT</subscript> characteristic is not degraded although the V<subscript>TH</subscript> was shifted by +18.5 V for the pull-up unit (TFT’s ΔV<subscript>TH</subscript> except for pull-up unit: +2 V), and the rising/falling time were confirmed to be less than 3.2 μs. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
02681242
Volume :
34
Issue :
6
Database :
Complementary Index
Journal :
Semiconductor Science & Technology
Publication Type :
Academic Journal
Accession number :
136549973
Full Text :
https://doi.org/10.1088/1361-6641/ab1fa6