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55‐3: Distinguished Paper: Development of G6 Exposure Tool for 1.2 µm Resolution.

Authors :
Nagano, Kouhei
Yabu, Nobuhiko
Hakko, Manabu
Ando, Miwako
Izumi, Nozomu
Osaki, Yoshinori
Source :
SID Symposium Digest of Technical Papers; Jun2019, Vol. 50 Issue 1, p769-772, 4p
Publication Year :
2019

Abstract

We have proposed exposure method using Deep UV (DUV) exposure light to realize high resolution and high productivity in FPD lithography. [1] Here we show development concepts for our new G6 exposure tools with DUV light sources, and exposure test results with a test exposure tool. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0097966X
Volume :
50
Issue :
1
Database :
Complementary Index
Journal :
SID Symposium Digest of Technical Papers
Publication Type :
Academic Journal
Accession number :
136710417
Full Text :
https://doi.org/10.1002/sdtp.13034