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Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam.

Details

Language :
English
ISSN :
0277786X
Volume :
11035
Database :
Complementary Index
Journal :
Proceedings of SPIE
Publication Type :
Conference
Accession number :
137633831
Full Text :
https://doi.org/10.1117/12.2520907