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a-Si 剩余膜厚对 TFT 特性的影响.
- Source :
- Chinese Journal of Liquid Crystal & Displays; Jul2019, Vol. 34 Issue 7, p646-651, 6p
- Publication Year :
- 2019
-
Abstract
- <i>Copyright of Chinese Journal of Liquid Crystal & Displays is the property of Chinese Journal of Liquid Crystal & Displays and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
- Subjects :
- CRITICAL point (Thermodynamics)
PHOTOGRAPHS
IONS
ECOLOGY
Subjects
Details
- Language :
- Chinese
- ISSN :
- 10072780
- Volume :
- 34
- Issue :
- 7
- Database :
- Complementary Index
- Journal :
- Chinese Journal of Liquid Crystal & Displays
- Publication Type :
- Academic Journal
- Accession number :
- 138286015
- Full Text :
- https://doi.org/10.3788/YJYXS20193407.0646