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Skewed-Load Tests for Transition and Stuck-at Faults.
- Source :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Oct2019, Vol. 38 Issue 10, p1969-1973, 5p
- Publication Year :
- 2019
-
Abstract
- Test generation procedures target a variety of fault models in order to produce test sets that are effective for defect detection. This paper considers the likely scenario where two-cycle skewed-load tests are generated to detect single transition faults, and the test set is complemented with tests for single stuck-at faults that are not detected by the transition fault test set. For this scenario, this paper makes several unique observations that can be utilized to produce a single compact test set that consists only of two-cycle skewed-load tests for both fault models. The first observation is that a single-cycle test for a stuck-at fault can be transformed into a skewed-load test that is guaranteed to detect the stuck-at fault without performing logic or fault simulation. The second observation is that skewed-load tests, which are transformed from single-cycle tests for stuck-at faults, sometimes detect more transition and stuck-at faults than tests that were generated for transition faults. The third observation is that a static test compaction procedure, which is based on the modification and removal of tests, is effective in this context because it allows tests for stuck-at faults to detect more transition faults and vice versa. This paper describes a test compaction procedure based on these observations and presents experimental results for benchmark circuits to demonstrate the effectiveness of the procedure. [ABSTRACT FROM AUTHOR]
- Subjects :
- TESTING
COMPACTING
ELECTRIC transients
Subjects
Details
- Language :
- English
- ISSN :
- 02780070
- Volume :
- 38
- Issue :
- 10
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
- Publication Type :
- Academic Journal
- Accession number :
- 138733251
- Full Text :
- https://doi.org/10.1109/TCAD.2018.2873233