21.3: Invited Paper: Non‐destructive testing for uniformity evaluation of thin film plate polarizers.

MLA

Wang, Kerson, and Hung-Xuan Trinh. “21.3: Invited Paper: Non‐destructive Testing for Uniformity Evaluation of Thin Film Plate Polarizers.” SID Symposium Digest of Technical Papers, vol. 50, Sept. 2019, pp. 207–09. EBSCOhost, https://doi.org/10.1002/sdtp.13442.

APA

Wang, K., & Trinh, H.-X. (2019). 21.3: Invited Paper: Non‐destructive testing for uniformity evaluation of thin film plate polarizers. SID Symposium Digest of Technical Papers, 50, 207–209. https://doi.org/10.1002/sdtp.13442

Chicago

Wang, Kerson, and Hung-Xuan Trinh. 2019. “21.3: Invited Paper: Non‐destructive Testing for Uniformity Evaluation of Thin Film Plate Polarizers.” SID Symposium Digest of Technical Papers 50 (September): 207–9. doi:10.1002/sdtp.13442.