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Measuring nanoscale thermal gradients in suspended MoS2 with STEM-EELS.

Authors :
Shen, Lang
Mecklenburg, Matthew
Dhall, Rohan
Regan, B. C.
Cronin, Stephen B.
Source :
Applied Physics Letters; 10/7/2019, Vol. 115 Issue 15, pN.PAG-N.PAG, 5p, 1 Chart, 4 Graphs
Publication Year :
2019

Abstract

Transition metal dichalcogenides such as molybdenum disulfide (MoS<subscript>2</subscript>) may see service in the heart of next-generation nanoelectronic devices, where highly localized power dissipation can produce nontrivial temperature gradients over nanometer-scale distances. Here, we demonstrate that MoS<subscript>2</subscript> is a promising target for plasmon energy expansion thermometry (PEET), a high-spatial resolution temperature mapping technique employed in a scanning transmission electron microscope (STEM) equipped with electron energy loss spectroscopy (EELS). We first use a calibrated, commercial MEMS-style TEM sample heater chip to measure the temperature dependence of the MoS<subscript>2</subscript> bulk plasmon. We corroborate the chip's temperature calibration with Raman thermometry and determine the bulk thermal expansion coefficient (TEC) of MoS<subscript>2</subscript> in the temperature range of 300–1100 K. Applying this TEC value to PEET measurements on a suspended MoS<subscript>2</subscript> flake, we map 70–90 K/μm temperature gradients with a submicrometer spatial resolution. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
115
Issue :
15
Database :
Complementary Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
139098970
Full Text :
https://doi.org/10.1063/1.5094443