A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap.

MLA

Szypryt, P., et al. “A Transition-Edge Sensor-Based x-Ray Spectrometer for the Study of Highly Charged Ions at the National Institute of Standards and Technology Electron Beam Ion Trap.” Review of Scientific Instruments, vol. 90, no. 12, Dec. 2019, pp. 1–19. EBSCOhost, https://doi.org/10.1063/1.5116717.

APA

Szypryt, P., O’Neil, G. C., Takacs, E., Tan, J. N., Buechele, S. W., Naing, A. S., Bennett, D. A., Doriese, W. B., Durkin, M., Fowler, J. W., Gard, J. D., Hilton, G. C., Morgan, K. M., Reintsema, C. D., Schmidt, D. R., Swetz, D. S., Ullom, J. N., & Ralchenko, Y. (2019). A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap. Review of Scientific Instruments, 90(12), 1–19. https://doi.org/10.1063/1.5116717

Chicago

Szypryt, P., G. C. O’Neil, E. Takacs, J. N. Tan, S. W. Buechele, A. S. Naing, D. A. Bennett, et al. 2019. “A Transition-Edge Sensor-Based x-Ray Spectrometer for the Study of Highly Charged Ions at the National Institute of Standards and Technology Electron Beam Ion Trap.” Review of Scientific Instruments 90 (12): 1–19. doi:10.1063/1.5116717.