An improved theoretical model of the resistive network for woven structured electronic textile.

In this article, a theoretical model of resistive network for woven conductive fabric is proposed to compute the resistance in warp and weft direction respectively. In order to enhance the accuracy of predicting the contact resistance and the length-related resistance, two cross-sectional entities, i.e. racetrack shape and elliptical shape are employed according to the density relationship between warp and weft directions. The comparison between the theoretical predictions of the resistance and the experimental results indicate that the proposed model has better accuracy, with standard deviations of 0.046 Ω in warp direction and 0.0059 Ω in weft direction. A further comparison with previous work has revealed an average improvement around 138.72%. It is believed this work has provided a solid theoretical basis for the precise resistance evaluation on the development of electronic textile based on woven structure. [ABSTRACT FROM AUTHOR]